Reformat the WebRTC code base

Running clang-format with chromium's style guide.

The goal is n-fold:
 * providing consistency and readability (that's what code guidelines are for)
 * preventing noise with presubmit checks and git cl format
 * building on the previous point: making it easier to automatically fix format issues
 * you name it

Please consider using git-hyper-blame to ignore this commit.

Bug: webrtc:9340
Change-Id: I694567c4cdf8cee2860958cfe82bfaf25848bb87
Reviewed-on: https://webrtc-review.googlesource.com/81185
Reviewed-by: Patrik Höglund <phoglund@webrtc.org>
Cr-Commit-Position: refs/heads/master@{#23660}
This commit is contained in:
Yves Gerey
2018-06-19 15:03:05 +02:00
parent b602123a5a
commit 665174fdbb
1569 changed files with 30495 additions and 30309 deletions

View File

@ -127,10 +127,10 @@ class ByteIoTest : public ::testing::Test {
};
TEST_F(ByteIoTest, Test16UBitBigEndian) {
TestRead<uint16_t, ByteReader<uint16_t>::ReadBigEndian,
sizeof(uint16_t)>(true);
TestWrite<uint16_t, ByteWriter<uint16_t>::WriteBigEndian,
sizeof(uint16_t)>(true);
TestRead<uint16_t, ByteReader<uint16_t>::ReadBigEndian, sizeof(uint16_t)>(
true);
TestWrite<uint16_t, ByteWriter<uint16_t>::WriteBigEndian, sizeof(uint16_t)>(
true);
}
TEST_F(ByteIoTest, Test24UBitBigEndian) {
@ -139,24 +139,23 @@ TEST_F(ByteIoTest, Test24UBitBigEndian) {
}
TEST_F(ByteIoTest, Test32UBitBigEndian) {
TestRead<uint32_t, ByteReader<uint32_t>::ReadBigEndian,
sizeof(uint32_t)>(true);
TestWrite<uint32_t, ByteWriter<uint32_t>::WriteBigEndian,
sizeof(uint32_t)>(true);
TestRead<uint32_t, ByteReader<uint32_t>::ReadBigEndian, sizeof(uint32_t)>(
true);
TestWrite<uint32_t, ByteWriter<uint32_t>::WriteBigEndian, sizeof(uint32_t)>(
true);
}
TEST_F(ByteIoTest, Test64UBitBigEndian) {
TestRead<uint64_t, ByteReader<uint64_t>::ReadBigEndian,
sizeof(uint64_t)>(true);
TestWrite<uint64_t, ByteWriter<uint64_t>::WriteBigEndian,
sizeof(uint64_t)>(true);
TestRead<uint64_t, ByteReader<uint64_t>::ReadBigEndian, sizeof(uint64_t)>(
true);
TestWrite<uint64_t, ByteWriter<uint64_t>::WriteBigEndian, sizeof(uint64_t)>(
true);
}
TEST_F(ByteIoTest, Test16SBitBigEndian) {
TestRead<int16_t, ByteReader<int16_t>::ReadBigEndian,
sizeof(int16_t)>(true);
TestWrite<int16_t, ByteWriter<int16_t>::WriteBigEndian,
sizeof(int16_t)>(true);
TestRead<int16_t, ByteReader<int16_t>::ReadBigEndian, sizeof(int16_t)>(true);
TestWrite<int16_t, ByteWriter<int16_t>::WriteBigEndian, sizeof(int16_t)>(
true);
}
TEST_F(ByteIoTest, Test24SBitBigEndian) {
@ -165,24 +164,22 @@ TEST_F(ByteIoTest, Test24SBitBigEndian) {
}
TEST_F(ByteIoTest, Test32SBitBigEndian) {
TestRead<int32_t, ByteReader<int32_t>::ReadBigEndian,
sizeof(int32_t)>(true);
TestWrite<int32_t, ByteWriter<int32_t>::WriteBigEndian,
sizeof(int32_t)>(true);
TestRead<int32_t, ByteReader<int32_t>::ReadBigEndian, sizeof(int32_t)>(true);
TestWrite<int32_t, ByteWriter<int32_t>::WriteBigEndian, sizeof(int32_t)>(
true);
}
TEST_F(ByteIoTest, Test64SBitBigEndian) {
TestRead<int64_t, ByteReader<int64_t>::ReadBigEndian,
sizeof(int64_t)>(true);
TestWrite<int64_t, ByteWriter<int64_t>::WriteBigEndian,
sizeof(int64_t)>(true);
TestRead<int64_t, ByteReader<int64_t>::ReadBigEndian, sizeof(int64_t)>(true);
TestWrite<int64_t, ByteWriter<int64_t>::WriteBigEndian, sizeof(int64_t)>(
true);
}
TEST_F(ByteIoTest, Test16UBitLittleEndian) {
TestRead<uint16_t, ByteReader<uint16_t>::ReadLittleEndian,
sizeof(uint16_t)>(false);
TestRead<uint16_t, ByteReader<uint16_t>::ReadLittleEndian, sizeof(uint16_t)>(
false);
TestWrite<uint16_t, ByteWriter<uint16_t>::WriteLittleEndian,
sizeof(uint16_t)>(false);
sizeof(uint16_t)>(false);
}
TEST_F(ByteIoTest, Test24UBitLittleEndian) {
@ -191,24 +188,24 @@ TEST_F(ByteIoTest, Test24UBitLittleEndian) {
}
TEST_F(ByteIoTest, Test32UBitLittleEndian) {
TestRead<uint32_t, ByteReader<uint32_t>::ReadLittleEndian,
sizeof(uint32_t)>(false);
TestRead<uint32_t, ByteReader<uint32_t>::ReadLittleEndian, sizeof(uint32_t)>(
false);
TestWrite<uint32_t, ByteWriter<uint32_t>::WriteLittleEndian,
sizeof(uint32_t)>(false);
sizeof(uint32_t)>(false);
}
TEST_F(ByteIoTest, Test64UBitLittleEndian) {
TestRead<uint64_t, ByteReader<uint64_t>::ReadLittleEndian,
sizeof(uint64_t)>(false);
TestRead<uint64_t, ByteReader<uint64_t>::ReadLittleEndian, sizeof(uint64_t)>(
false);
TestWrite<uint64_t, ByteWriter<uint64_t>::WriteLittleEndian,
sizeof(uint64_t)>(false);
sizeof(uint64_t)>(false);
}
TEST_F(ByteIoTest, Test16SBitLittleEndian) {
TestRead<int16_t, ByteReader<int16_t>::ReadLittleEndian,
sizeof(int16_t)>(false);
TestWrite<int16_t, ByteWriter<int16_t>::WriteLittleEndian,
sizeof(int16_t)>(false);
TestRead<int16_t, ByteReader<int16_t>::ReadLittleEndian, sizeof(int16_t)>(
false);
TestWrite<int16_t, ByteWriter<int16_t>::WriteLittleEndian, sizeof(int16_t)>(
false);
}
TEST_F(ByteIoTest, Test24SBitLittleEndian) {
@ -217,17 +214,17 @@ TEST_F(ByteIoTest, Test24SBitLittleEndian) {
}
TEST_F(ByteIoTest, Test32SBitLittleEndian) {
TestRead<int32_t, ByteReader<int32_t>::ReadLittleEndian,
sizeof(int32_t)>(false);
TestWrite<int32_t, ByteWriter<int32_t>::WriteLittleEndian,
sizeof(int32_t)>(false);
TestRead<int32_t, ByteReader<int32_t>::ReadLittleEndian, sizeof(int32_t)>(
false);
TestWrite<int32_t, ByteWriter<int32_t>::WriteLittleEndian, sizeof(int32_t)>(
false);
}
TEST_F(ByteIoTest, Test64SBitLittleEndian) {
TestRead<int64_t, ByteReader<int64_t>::ReadLittleEndian,
sizeof(int64_t)>(false);
TestWrite<int64_t, ByteWriter<int64_t>::WriteLittleEndian,
sizeof(int64_t)>(false);
TestRead<int64_t, ByteReader<int64_t>::ReadLittleEndian, sizeof(int64_t)>(
false);
TestWrite<int64_t, ByteWriter<int64_t>::WriteLittleEndian, sizeof(int64_t)>(
false);
}
// Sets up a fixed byte array and converts N bytes from the array into a