Reformat the WebRTC code base
Running clang-format with chromium's style guide. The goal is n-fold: * providing consistency and readability (that's what code guidelines are for) * preventing noise with presubmit checks and git cl format * building on the previous point: making it easier to automatically fix format issues * you name it Please consider using git-hyper-blame to ignore this commit. Bug: webrtc:9340 Change-Id: I694567c4cdf8cee2860958cfe82bfaf25848bb87 Reviewed-on: https://webrtc-review.googlesource.com/81185 Reviewed-by: Patrik Höglund <phoglund@webrtc.org> Cr-Commit-Position: refs/heads/master@{#23660}
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@ -127,10 +127,10 @@ class ByteIoTest : public ::testing::Test {
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};
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TEST_F(ByteIoTest, Test16UBitBigEndian) {
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TestRead<uint16_t, ByteReader<uint16_t>::ReadBigEndian,
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sizeof(uint16_t)>(true);
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TestWrite<uint16_t, ByteWriter<uint16_t>::WriteBigEndian,
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sizeof(uint16_t)>(true);
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TestRead<uint16_t, ByteReader<uint16_t>::ReadBigEndian, sizeof(uint16_t)>(
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true);
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TestWrite<uint16_t, ByteWriter<uint16_t>::WriteBigEndian, sizeof(uint16_t)>(
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true);
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}
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TEST_F(ByteIoTest, Test24UBitBigEndian) {
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@ -139,24 +139,23 @@ TEST_F(ByteIoTest, Test24UBitBigEndian) {
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}
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TEST_F(ByteIoTest, Test32UBitBigEndian) {
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TestRead<uint32_t, ByteReader<uint32_t>::ReadBigEndian,
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sizeof(uint32_t)>(true);
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TestWrite<uint32_t, ByteWriter<uint32_t>::WriteBigEndian,
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sizeof(uint32_t)>(true);
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TestRead<uint32_t, ByteReader<uint32_t>::ReadBigEndian, sizeof(uint32_t)>(
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true);
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TestWrite<uint32_t, ByteWriter<uint32_t>::WriteBigEndian, sizeof(uint32_t)>(
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true);
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}
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TEST_F(ByteIoTest, Test64UBitBigEndian) {
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TestRead<uint64_t, ByteReader<uint64_t>::ReadBigEndian,
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sizeof(uint64_t)>(true);
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TestWrite<uint64_t, ByteWriter<uint64_t>::WriteBigEndian,
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sizeof(uint64_t)>(true);
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TestRead<uint64_t, ByteReader<uint64_t>::ReadBigEndian, sizeof(uint64_t)>(
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true);
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TestWrite<uint64_t, ByteWriter<uint64_t>::WriteBigEndian, sizeof(uint64_t)>(
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true);
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}
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TEST_F(ByteIoTest, Test16SBitBigEndian) {
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TestRead<int16_t, ByteReader<int16_t>::ReadBigEndian,
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sizeof(int16_t)>(true);
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TestWrite<int16_t, ByteWriter<int16_t>::WriteBigEndian,
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sizeof(int16_t)>(true);
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TestRead<int16_t, ByteReader<int16_t>::ReadBigEndian, sizeof(int16_t)>(true);
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TestWrite<int16_t, ByteWriter<int16_t>::WriteBigEndian, sizeof(int16_t)>(
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true);
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}
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TEST_F(ByteIoTest, Test24SBitBigEndian) {
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@ -165,24 +164,22 @@ TEST_F(ByteIoTest, Test24SBitBigEndian) {
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}
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TEST_F(ByteIoTest, Test32SBitBigEndian) {
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TestRead<int32_t, ByteReader<int32_t>::ReadBigEndian,
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sizeof(int32_t)>(true);
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TestWrite<int32_t, ByteWriter<int32_t>::WriteBigEndian,
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sizeof(int32_t)>(true);
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TestRead<int32_t, ByteReader<int32_t>::ReadBigEndian, sizeof(int32_t)>(true);
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TestWrite<int32_t, ByteWriter<int32_t>::WriteBigEndian, sizeof(int32_t)>(
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true);
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}
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TEST_F(ByteIoTest, Test64SBitBigEndian) {
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TestRead<int64_t, ByteReader<int64_t>::ReadBigEndian,
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sizeof(int64_t)>(true);
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TestWrite<int64_t, ByteWriter<int64_t>::WriteBigEndian,
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sizeof(int64_t)>(true);
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TestRead<int64_t, ByteReader<int64_t>::ReadBigEndian, sizeof(int64_t)>(true);
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TestWrite<int64_t, ByteWriter<int64_t>::WriteBigEndian, sizeof(int64_t)>(
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true);
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}
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TEST_F(ByteIoTest, Test16UBitLittleEndian) {
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TestRead<uint16_t, ByteReader<uint16_t>::ReadLittleEndian,
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sizeof(uint16_t)>(false);
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TestRead<uint16_t, ByteReader<uint16_t>::ReadLittleEndian, sizeof(uint16_t)>(
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false);
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TestWrite<uint16_t, ByteWriter<uint16_t>::WriteLittleEndian,
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sizeof(uint16_t)>(false);
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sizeof(uint16_t)>(false);
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}
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TEST_F(ByteIoTest, Test24UBitLittleEndian) {
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@ -191,24 +188,24 @@ TEST_F(ByteIoTest, Test24UBitLittleEndian) {
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}
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TEST_F(ByteIoTest, Test32UBitLittleEndian) {
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TestRead<uint32_t, ByteReader<uint32_t>::ReadLittleEndian,
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sizeof(uint32_t)>(false);
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TestRead<uint32_t, ByteReader<uint32_t>::ReadLittleEndian, sizeof(uint32_t)>(
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false);
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TestWrite<uint32_t, ByteWriter<uint32_t>::WriteLittleEndian,
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sizeof(uint32_t)>(false);
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sizeof(uint32_t)>(false);
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}
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TEST_F(ByteIoTest, Test64UBitLittleEndian) {
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TestRead<uint64_t, ByteReader<uint64_t>::ReadLittleEndian,
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sizeof(uint64_t)>(false);
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TestRead<uint64_t, ByteReader<uint64_t>::ReadLittleEndian, sizeof(uint64_t)>(
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false);
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TestWrite<uint64_t, ByteWriter<uint64_t>::WriteLittleEndian,
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sizeof(uint64_t)>(false);
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sizeof(uint64_t)>(false);
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}
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TEST_F(ByteIoTest, Test16SBitLittleEndian) {
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TestRead<int16_t, ByteReader<int16_t>::ReadLittleEndian,
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sizeof(int16_t)>(false);
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TestWrite<int16_t, ByteWriter<int16_t>::WriteLittleEndian,
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sizeof(int16_t)>(false);
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TestRead<int16_t, ByteReader<int16_t>::ReadLittleEndian, sizeof(int16_t)>(
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false);
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TestWrite<int16_t, ByteWriter<int16_t>::WriteLittleEndian, sizeof(int16_t)>(
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false);
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}
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TEST_F(ByteIoTest, Test24SBitLittleEndian) {
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@ -217,17 +214,17 @@ TEST_F(ByteIoTest, Test24SBitLittleEndian) {
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}
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TEST_F(ByteIoTest, Test32SBitLittleEndian) {
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TestRead<int32_t, ByteReader<int32_t>::ReadLittleEndian,
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sizeof(int32_t)>(false);
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TestWrite<int32_t, ByteWriter<int32_t>::WriteLittleEndian,
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sizeof(int32_t)>(false);
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TestRead<int32_t, ByteReader<int32_t>::ReadLittleEndian, sizeof(int32_t)>(
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false);
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TestWrite<int32_t, ByteWriter<int32_t>::WriteLittleEndian, sizeof(int32_t)>(
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false);
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}
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TEST_F(ByteIoTest, Test64SBitLittleEndian) {
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TestRead<int64_t, ByteReader<int64_t>::ReadLittleEndian,
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sizeof(int64_t)>(false);
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TestWrite<int64_t, ByteWriter<int64_t>::WriteLittleEndian,
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sizeof(int64_t)>(false);
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TestRead<int64_t, ByteReader<int64_t>::ReadLittleEndian, sizeof(int64_t)>(
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false);
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TestWrite<int64_t, ByteWriter<int64_t>::WriteLittleEndian, sizeof(int64_t)>(
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false);
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}
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// Sets up a fixed byte array and converts N bytes from the array into a
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